For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
This in-depth discussion of scan-based testing explores the benefits, implementation, and possible problems of AC scan. Today�s large, complex chips present an entirely new set of test issues for ...
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