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Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
TEMPE, Ariz.--(BUSINESS WIRE)--Flow Technology (FTI), a leading manufacturer of precision flow measurement instruments, systems and calibrators, introduces the ClearPath | Flow™ Series ultrasonic flow ...
The kSA MOS Ultra-Scan is a flexible, high-resolution scanning curvature and stress measurement system. Based on proven kSA MOS technology, this fully integrated ex-situ tool maps the curvature of ...
DOWNERS GROVE, Ill., May 9, 2022 /PRNewswire/ -- Dover (NYSE: DOV) announced today that it has entered into a definitive agreement to acquire Malema Engineering Corporation ("Malema"), a designer and ...
Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...
As chip manufacturing scales up, water supply and wastewater treatment systems are under immense pressure. Cutting-edge ...
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