The µHELIX® line of durable, fine-pitch probes is designed to test electrical targets with ±15-micron pointing accuracy on 10-mil center-to-center placement. Probe diameter sizes are 20, 16, 12, and 8 ...

Why are test points a crucial element in developing a successful circuit? Types of test points available, and the different techniques that employ them. Electronic design has always been an endeavor ...

Nanoparticles are emerging as powerful tools for research, therapeutic, and diagnostic applications. In particular, their utility as lateral flow test probes has gained prominence amid the COVID-19 ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

With its 400-MHz bandwidth, the HVD3220 differential probe from Teledyne LeCroy permits in-circuit GaN and SiC system testing. The high-voltage probe carries a 1500-VDC CAT III rating, as well as a ...

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

[Piffpaffpoltrie] had a problem. They found the InLine VA40R to be a perfectly usable multimeter, except for a couple of flaws. Most glaring among these were the tiny sockets for the test probes.