In the age of digital residents, semiconductor chips are present in almost every aspect of our lives. Whether it is from data centers to computers, cell phones, computer central processing units, and ...

Testing chips with more transistors and smaller, more intricate architectures is significantly more time-consuming than it is for their legacy predecessors. With reducing time to market being the end ...

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

For as long as semiconductor devices have been around, motor vehicles have been one of the toughest operating environments. Chips in automobiles, trucks, and buses are subject to extremes of ...